Keywords: Yoon, Tabassi and Iyer (15465472014).jpg Soweon Yoon left a NIST guest researcher from Michigan State University Elham Tabassi center a NIST electronics engineer and Hari Iyer right a faculty appointee Colorado State University are working to develop a statistical measure of uncertainty for decisions about forensic fingerprint comparisons See http //www nist gov/itl/iad/ig/sfra cfm www nist gov/itl/iad/ig/sfra cfm Credit NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/15465472014/ Yoon Tabassi and Iyer 2014-11-25 14 33 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/15465472014 2016-09-07 01 32 06 United States Government Work Uncategorized 2016 November 20 |