MAKE A MEME View Large Image Strained Silicon Devices (5884869654).jpg X-ray topographs of three different strata of a strained-silicon wafer show close correspondence in defects from the base silicon layer top through the final strained-silicon layer bottom Color has ...
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Keywords: Strained Silicon Devices (5884869654).jpg X-ray topographs of three different strata of a strained-silicon wafer show close correspondence in defects from the base silicon layer top through the final strained-silicon layer bottom Color has been added for contrast one particular defect area is highlighted Courtesy National Institute of Standards and Technology Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5884869654/ Strained Silicon Devices 2006-07-06 10 34 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5884869654 2016-09-07 02 51 07 United States Government Work Uncategorized 2016 December 20
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