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| Keywords: Rochester Community and Technical College Tour (7157844906).jpg John Suehle left of NIST ™s Physical Measurement Laboratory ™s Semiconductor and Dimensional Metrology Division explains to students and faculty from Rochester Community and Technical College in Rochester MN that size of microelectronic devices is rapidly approaching the nanoscale regime Devices used in the future generations of microprocessors will only be 20 times larger than a DNA molecule Credit NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/7157844906/ Rochester Community and Technical College Tour 2012-04-02 10 59 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/7157844906 2016-09-07 01 50 57 United States Government Work Uncategorized 2016 November 19 | ||||
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