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| Keywords: NIST Team Develops Novel Method for Nanostructured Polymer Thin Films (5940503429).jpg Schematic of the NIST 'cold zone' annealing process for polymer thin films on a semiconductor wafer Experiment images are color-coded to show regions with different cylinder orientations as measured by atomic force microscopy Relatively rapid transit times middle leave a jumble of different regions that become largely homogeneous at slower speeds right Credit NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5940503429/ NIST Team Develops Novel Method for Nanostructured Polymer Thin Films 2007-09-13 15 17 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5940503429 2016-09-07 02 11 24 United States Government Work Uncategorized 2016 December 20 | ||||
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