Keywords: Helium Ion Microscope (5887833384).jpg In-depth look An image of gold atoms on tin from a state-of-the-art scanning electron microscope left has relatively poor depth of field - only parts of the image are in sharp focus By contrast the entire image from a helium ion microscope image right is sharp and clear NIST researchers are studying helium ion microscopes to improve measurements at the nanoscale that are important to the semiconductor and nanomanufacturing industries Credit NIST Disclaimer Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST Use of NIST Information These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology NIST With the exception of material marked as copyrighted information presented on these pages is considered public information and may be distributed or copied Use of appropriate byline/photo/image credits is requested https //www flickr com/photos/usnistgov/5887833384/ Helium Ion Microscope 2008-09-02 16 59 https //www flickr com/people/63059536 N06 National Institute of Standards and Technology PD-USGov National Institute of Standards and Technology https //flickr com/photos/63059536 N06/5887833384 2016-09-07 02 33 30 United States Government Work Uncategorized 2016 October 29 |