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| Keywords: AFMimageRoughGlass20x20.JPG Atomic force microscope topographical scan of a glass surface The micro and nano-scale features of the glass can be observed portraying the roughness of the material The image space is x y z 20um x 20um x 420nm The AFM used was the Veeco di CP-II scanned in contact mode Constructed at the Nanorobotics Laboratory at Carnegie Mellon University http //nanolab me cmu edu AFMimageRoughGlass20x20 png 2009-07-14 23 32 UTC AFMimageRoughGlass20x20 png Chych derivative work Materialscientist <span class signature-talk >talk</span> Atomic force microscopy | ||||
